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Scanning electron microscopy and x-ray microanalysis

New York : Springer, 2003

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  • Titre:
    Scanning electron microscopy and x-ray microanalysis
  • Sujets: Microscopie électronique à balayage ;
    Microanalyse par émission X ;
    Argile ;
    Sol ;
    Polymère ;
    Biomatériau ;
    Céramique ;
    Métal ;
    Analyse quantitative ;
    Analyse qualitative ;
    Spectrométrie RX ;
    Microanalyse ;
    Microscopie électronique balayage
  • Description: Mines : Introduction. The SEM and its modes of operation. Electron beam-specimen interactions. Image formation and interpretation. Special topics in scanning electron micrsocopy. Generation of X-rays in the SEM specimen. X-ray spectral measurement EDS and WDS. Qualitative X-ray analysis. Quantitative X-ray analysis : the basics. Special topics in electron beam X-ray microanalysis. Specimen preparation of hard materials : metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles and fibers. Specimen preparation of polymer materials. Ambient-temperature specimen preparation of biological material. Low temperature specimen preparation. Procedures for elimination of charging in nonconducting specimens
  • Éditeur: New York : Springer
  • Date de publication: 2003
  • Format: 1 vol. (XIX-690 p., [3] p. de pl.) : ill. (certaines en coul. ) ; 26 cm + 1 cédérom (12 cm)
  • Langue: Anglais
  • Identifiant: ISBN 0-306-47292-9 ;ISBN 978-0-306-47292-3
  • Source: Mines ParisTech (catalogue)

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