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Transmission electron microscopy : A textbook for materials science

WILLIAMS, David B. ; CARTER, C. Barry

New York : Plenum press, 1996

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  • Titre:
    Transmission electron microscopy : A textbook for materials science
  • Auteur: WILLIAMS, David B.
  • Autre(s) auteur(s): CARTER, C. Barry
  • Sujets: Appareillage;
    Diffraction;
    Formation image;
    Microscopie électronique transmission;
    Spectrométrie perte énergie;
    Spectrométrie RX
  • Description: Mines : The transmission electron microscope. Scattering and diffraction. Elastic scattering. Inelastic scattering and beam damage. Electron sources. Lenses, apertures and resolution. How to see electrons. Pumps and holders. The instrument. Specimen preparation. Diffraction patterns. Thinking in reciprocal space. Diffracted beams. Bloch waves. Dispersion surfaces. Diffraction from crystals. Diffraction from small volumes. Indexing diffraction patterns. Kikuchi diffraction. Obtaining CBED patterns. Using convergent beam techniques. Imaging in the TEM. Thickness and bending effects. Planar defects. Strain fields. Weak beam dark field microscopy. Phase contrast images. High resolution TEM. Image simulation. Quantifying and processing HRTEM images. Other imaging techniques. X-ray spectrometry. The XEDS-TEM sinterface. Qualitative X-ray analysis. Quantitative X-ray microanalysis. Spatial resolution and minimum detectability. Electron energy loss spectrometers. The energy loss spectrum. Microanalysis with ionization loss electrons. Everything else in the spectrum
  • Éditeur: New York : Plenum press
  • Date de publication: 1996
  • Format: 729 p. ; 30 cm
  • Langue: Anglais
  • Identifiant: ISBN 0-306-45247-2
  • Source: Mines ParisTech (catalogue)

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